TITLE

Dependability Issues in Intelligent Systems

PRESENTER

Prof. Matteo Sonza Reorda, Polytechnic of Turin, Italy

DESCRIPTION

The widespread adoption of intelligent systems in many application domains has been made possible by the availability of very complex circuits manufactured with advanced semiconductor technologies. In order to fulfill the application requirements, these circuits must work correctly, i.e., they must be free of any fault possibly affecting their hardware. This requires among the other points the ability to detect faulty products at the end of the manufacturing phase and to guarantee the ability of each circuit to work correctly during its operational life. This lecture will introduce the key concepts and terminology concerning the above issues, summarizing the main solutions adopted to minimize the probability of faulty circuits to reach the operational phase, and to mitigate the effects of possible faults affecting the circuits in the field.

ABOUT THE SPEAKER

Prof. Matteo Sonza Reorda took the M.Sc. degree in Electronics in 1986 and the Ph.D. degree in Computer Engineering in 1990, both from Politecnico di Torino (Italy). Since 1990 he is with the Department of Control and Computer Engineering of the Politecnico di Torino, where he currently is a Full Professor and leads a research group working on test and fault tolerant design of ICs and systems. He published more than 400 papers on these topics, and is involved in several research projects with companies and public bodies. He is a Fellow of IEEE.